6 Silicon Wafer With Pattern For Probe Testing, Alignment, Etc. (Qty. 10)

6 AMI Semiconductor Patterned Silicon Wafer – Ideal for Probe Testing, Alignment, R&D & Process Development. Authentic 6-inch silicon wafer manufactured by. Featuring original lithographically patterned device structures. These production wafers are highly useful for engineering environments where real semiconductor topography and metalized features are needed for evaluation, setup, and testing. Probe station testing & training – practice contacting pads, needle alignment, continuity checks, and microscope work. Vision system calibration – machine vision, autofocus, edge detection, die recognition. Alignment & metrology – microscope calibration, overlay inspection, stage repeatability tests. University & R&D labs – semiconductor process demonstrations, failure analysis training, reverse engineering studies. Tool service companies – setup wafers for probers, steppers, aligners, dicing saws, handlers, etc. Diameter: 6 inch / 150 mm. Condition: Surplus / used process wafer. Surface contains original semiconductor device patterns.